Secure. Fast. Effective.

The V-Loc™ wound closure device is a revolutionary technology that eliminates the need to tie knots, so you can close incisions up to 50% faster without compromising strength and security.([FOOTNOTE=Time Motion Study – Comparison of wound closure time using conventional techniques and knotless, self-anchoring surgical sutures in ex-vivo porcine model for both single layer and double layer closure in all closure techniques. Royal College of Surgeons, London, UK; Covidien V-Loc™ 180 Absorbable Wound Closure Device Time Study, Robert T. Grant, MD, MSc, FACS, New York-Presbyterian Hospital, Argent Global Services.],[ANCHOR=],[LINK=]),([FOOTNOTE=Utilization of a Porcine Model to Demonstrate the Efficacy of an Absorbable Barbed Suture for Dermal Closure, UTSW, S. Brown.],[ANCHOR=],[LINK=])

The V-Loc™ device has the potential to offer secure, fast, and effective incision closure for your patients.

At Medtronic, our robust manufacturing and quality testing processes ensure that the innovative products we put in your hands are reliable and user-friendly.

We have been upholding and advancing the standards of effectiveness for sutures for many years. The V-Loc™ device is another example of how our 100-plus years of sutures expertise has introduced some of the industry's most important innovations. That's one of the reasons why hospitals around the world count on Medtronic, every day.

V-LocTM Wound Closure Devices

See our Step-by Step guide to dermal wound closure applications.

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See the Difference

Discover the Secure Advantage

Learn why the V-Loc™ device is the preferred barbed suture vs. the Stratafix™* Spiral.

Witness the Barbed Suture Challenge

See how the V-Loc™ wound closure device provides greater suture strength compared to the Stratafix™* Spiral.([FOOTNOTE=Zaruby J, Gingras K, Taylor J, Maul D. An in vivo comparison of barbed suture devices and conventional monofilament sutures for cosmetic skin closure: biomechanical wound strength and histology. Aesthet Surg J. 2011:31(2):232-240. doi: 10.1177/1090820X10395010.],[ANCHOR=],[LINK=])